Epitaxial SrRuO3/SrTiO3(100) analyzed using x-ray photoelectron spectroscopy

Sputter-cleaned Epitaxial VxMo(1-x)Ny/MgO(001) Thin Films Analyzed by X-ray Photoelectron Spectroscopy: 3. Polycrystalline V0.49Mo0.51N1.02

VxMo(1-x)Ny thin films grown by ultrahigh vacuum reactive magnetron sputter deposition on MgO(001) substrates are analyzed by x-ray photoelectron spectroscopy (XPS). This contribution presents analytical results for 300-nm-thick 002-textured polycrystalline V0.49Mo0.51N1.02 films deposited by reactive cosputtering from V (99.95 % purity) and Mo (99.95 % purity) targets. Film growth is carried o...

Highly sensitive nitric oxide detection using X-ray photoelectron spectroscopy.

Nitric oxide (NO) is important physiologically as a gaseous messenger in the central nervous system;1 its level is also associated with several disease states.2 The concentration of NO in these cases is in the nanomolar range; therefore accurate and direct detection of NO at these levels is important. NO is also a decomposition product of several explosives3 so detection of trace amounts of exp...

X - Ray Photoelectron Spectroscopy of Silicate Glasses

X-ray photoelectron spectroscopy (XPS) is a powerful technique capable of providing unique information about the structural chemistry of glasses. However, inappropriate procedures for the preparation of sample surfaces or the lack of reliable methods to overcome electrostatic charging effects during analysis of dielectric materials can cause spurious features to be introduced or intrinsic featu...

Sputter-cleaned Epitaxial VxMo(1-x)Ny/MgO(001) Thin Films Analyzed by X-ray Photoelectron Spectroscopy: 2. Single-crystal V0.47Mo0.53N0.92

Epitaxial VxMo(1-x)Ny thin films grown by ultrahigh vacuum reactive magnetron sputter deposition on MgO(001) substrates are analyzed by x-ray photoelectron spectroscopy (XPS). This contribution presents analytical results for 300-nm-thick single-crystal V0.47Mo0.53N0.92/MgO(001) films deposited by reactive cosputtering from V (99.95% purity) and Mo (99.95% purity) targets. Film growth is carrie...

Surface and core hole effects in X-ray photoelectron spectroscopy